用户可以根据仿真系统的特殊需要以及性能要求单独购买额外的I/O板卡。列表中展示的是所有经过OPAL-RT工程师团队严挑细选并预先配置的可选I/O板卡。
10 sub-modules FB/HB
Emergency shutoff panel for maximum safety operations
Measurement Box
Inductance Box
Rackmount hardware interface (RJ45, BNC, Screw Terminal) for DB37 connections
Emergency shutoff panel for maximum safety operations
具备脉冲宽度调制（PWM）和编码器功能的高电压和高电流RCP接口
16 个虚拟输出， 2 MS/s, 16 bits, 1 us 转换时间，+/- 16V
Current Differential Relay. Application for up to four winding transformers. DNP3 and IEC61850 GOOSE communication.
Digital multimeter for smart grid, bridges the gap between traditional power technology and new digital communication
Half-bridge Power Module, 46A/400V, galvanic isolation, up to 50 kHz switching frequency
Half-bridge Power Module, 32A/800V, galvanic isolation, up to 50 kHz switching frequency
H-bridge Power Module, 15A/200V, galvanic isolation, up to 50 kHz switching frequency
H-bridge Power Module, 10A/400V, galvanic isolation, up to 50 kHz switching frequency
RCP development platform with TI commercial DSPs
16 个虚拟输出， 2 MS/s, 16 bits, 1 us 转换时间，+/- 16V
16个虚拟输入通道，16 bits, 2 MS/s, ±20V
利用可用高速连接进行外部通讯的8X SFP载板
信号调节板卡：能够将8个逻辑信号转换成8个光纤信号或是将8个光纤信号转换成8个数字逻辑信号
可调节600V高压和50A高电流等比例缩减模块
大功率前后调节功率放大器
针对ECU电力方案的定制化硬件调节和线路解决方案
集成所有负载元素的定制化硬件调节和线路解决方案
手动电路故障（开路和短路）测试及监控电子设备
250VDC数字输出控制继电器
将灵活性和故障输入但愿与接线盒功能结合在一起的模块化接线系统
自动电路故障（开路和短路）测试及监控设备
最小测试带宽为200kHz的±50A电流隔离传感器
最小测量带宽为60kHz的±800V电压隔离传感器
能够支持功率高达100kW模块的Powertrench换流器附件
If you need help to install or use OPAL-RT’s products, please contact OPAL-RT Technical Support >
Discover OPAL-RT’s new range of flexible and configurable conditioning boards with Fault Insertion (FIU) for National Instruments’ Switch, Load, and Signal Conditioning (SLSC) platform.
The SLSC modules enables HIL users to maximize their time and resources through our configurable signal conditioning stage, ensuring that signals are the right level and type, as well as by providing configuration for voltage level shifting, dividing and multiplying or integrated filters and impedance matching.
Every card provides an on-board flexible fault insertion unit (FIU) giving full relay control during testing when applying faults to the Device Under Test (DUT) through NI’s VeriStand interface.
OPAL-RT’s SLSC conditioning boards are part of the Automotive HIL Testbed Reference Architecture, which is an open and customizable solution allowing engineers to test and develop Electric Vehicles and Battery Management Systems in real time, using latest technologies.
With the Automotive HIL Testbed Reference Architecture, OPAL-RT provides an open, flexible solution that you can customize to adapt to changing research requirements for Electric Vehicle and Battery Management System testing.
By combining modular hardware and our FPGA-based simulation solver to easily import real-time models created with any modeling software, these systems help you take advantage of third party components to i) reduce your setup burden and ii) offer a common starting place for your research team members around the world.
With the Automotive HIL Testbed Reference Architecture, researchers can prototype a wide variety of electrical vehicular devices under test (DUTs).
By guiding the integration of complex automotive testing structures and helping engineers to develop specific EV and BMS HIL testing architecture based on best integration practices, OPAL-RT enables automotive manufacturers to cut costs, reduce risks and improve time-to-market.
The solution combines hardware and software from OPAL-RT, National Instruments, and other prime partners in order that each component can provide robust and unique functionality to leverage your EV & BMS testing systems.
The OPAL-RT & Comemso BMS test bench approach allows users to integrate the BMS testing designed for electrical vehicles. OPAL-RT’s NI partnership solution makes it easier to migrate existing physical testbeds onto real-time HIL simulation platforms when testing all type of BMS testing projects. OPAL-RT provides the engineering required to extend the BMS HIL test bench’s functionalities, from extra protection, shunt emulation, break-out box, current and voltage sensing to complete integration of other controls for electrical vehicles, ADAS systems or a complete vehicle.
