针对电磁暂态实时仿真的完整平台
OPAL-RT将我们的创新电力电子解算器eHS用于HYPERSIM上：
CPU和FPGA混合平台为您呈现强大的纳秒解算器
搜索您需要的技术论文、演讲、报告以及产品手册
OPAL-RT是PC/FPGA实时仿真器，硬件在环（HIL）测试设备和快速控制原型（RCP）系统的世界领导者。目前，我们的产品已被全球不同企业以及研发中心和大学用于电网、电力电子、电机、汽车、火车和飞机等的设计、测试和控制保护设备的优化和研发中。
OPAL-RT隆重推出HYPERSIM On Demand，一个能够帮您加速电力系统设备原型搭建、开发和测试的仿真平台。这一全新解决方案让您能够在多个云仿真器上并行实施仿真测试，同时为您呈现优于标准电磁暂态仿真软件的惊人性能。
Discover OPAL-RT’s new range of flexible and configurable conditioning boards with Fault Insertion (FIU) for National Instruments’ Switch, Load, and Signal Conditioning (SLSC) platform.
The SLSC modules enables HIL users to maximize their time and resources through our configurable signal conditioning stage, ensuring that signals are the right level and type, as well as by providing configuration for voltage level shifting, dividing and multiplying or integrated filters and impedance matching.
Every card provides an on-board flexible fault insertion unit (FIU) giving full relay control during testing when applying faults to the Device Under Test (DUT) through NI’s VeriStand interface.
OPAL-RT’s SLSC conditioning boards are part of the Automotive HIL Testbed Reference Architecture, which is an open and customizable solution allowing engineers to test and develop Electric Vehicles and Battery Management Systems in real time, using latest technologies.
With the Automotive HIL Testbed Reference Architecture, OPAL-RT provides an open, flexible solution that you can customize to adapt to changing research requirements for Electric Vehicle and Battery Management System testing.
By combining modular hardware and our FPGA-based simulation solver to easily import real-time models created with any modeling software, these systems help you take advantage of third party components to i) reduce your setup burden and ii) offer a common starting place for your research team members around the world.
With the Automotive HIL Testbed Reference Architecture, researchers can prototype a wide variety of electrical vehicular devices under test (DUTs).
By guiding the integration of complex automotive testing structures and helping engineers to develop specific EV and BMS HIL testing architecture based on best integration practices, OPAL-RT enables automotive manufacturers to cut costs, reduce risks and improve time-to-market.
The solution combines hardware and software from OPAL-RT, National Instruments, and other prime partners in order that each component can provide robust and unique functionality to leverage your EV & BMS testing systems.
The OPAL-RT & Comemso BMS test bench approach allows users to integrate the BMS testing designed for electrical vehicles. OPAL-RT’s NI partnership solution makes it easier to migrate existing physical testbeds onto real-time HIL simulation platforms when testing all type of BMS testing projects.
OPAL-RT provides the engineering required to extend the BMS HIL test bench’s functionalities, from extra protection, shunt emulation, break-out box, current and voltage sensing to complete integration of other controls for electrical vehicles, ADAS systems or a complete vehicle.
