功率硬件在环（PHIL）仿真是HIL的延伸，意味着实时仿真环境不只可以交换低电压，低电流信号，而且可以根据被测试设备（DUT）需要的电压进行交换。为了填补这一电压电流差异，功率放大器被接入高电压被测设备和低电压仿真器I/O间，同时为正确闭环提供必要反馈。通过其闭环性能以及发送和吸收功率的能力为用户应用选择合适的功率放大器。
尽管HIL和闭环测试带来很多优势，PHIL实现了被测设备之间，以及和仿真器仿真电路之间的更高功率的仿真。这一性能让工程师们能够测试包括功率转换器、发电机、电动机和PV负载等多个系统，同时得益于高精确仿真带来的优于传统仿真平台和功率计量的更高灵活性和安全性。
当与高质量功率放大器结合在一起时，高精确实时电力电子以及电力系统模型与动态模拟仿真平台的性能相符，意味着被测系统性能将基本符合预期。
OPAL-RT仿真器包含标准或定制功率放大器，满足电力应用中最严格的要求：高精确度，低失真率，高带宽，低相位延迟等。
比起动态模拟测试平台，PHIL让开发者们可以测试更多种系统特性，而无需大量维护或设置时间。这就使得利用多种参数、特性和故障对硬件鲁棒性进行深度测试成为可能。
PHIL仿真让那些不易实现或有危险的测试变得可能。这一程序还可以在没有真实电机或复杂系统的情况下实现逆变器热力测试。
简而言之，PHIL测试加强了操作的安全性，同时帮助开发更安全的产品和系统。
AMETEK在为不同工业领域提供测试测量用的精确可编程电力产品及系统方面有超过40年的经验
针对电力电子，通信和汽车领域的电感原件供应商
电力设备设计、能源转换系统和电力电子仪器领导者
Triphase提供的功率放大器使得OPAL-RT实时仿真器能够与高功率设备连成环
Chroma提供针对所有应用的可编程、可重复利用的功率测试设备和系统
If you need help to install or use OPAL-RT’s products, please contact OPAL-RT Technical Support >
Discover OPAL-RT’s new range of flexible and configurable conditioning boards with Fault Insertion (FIU) for National Instruments’ Switch, Load, and Signal Conditioning (SLSC) platform.
The SLSC modules enables HIL users to maximize their time and resources through our configurable signal conditioning stage, ensuring that signals are the right level and type, as well as by providing configuration for voltage level shifting, dividing and multiplying or integrated filters and impedance matching.
Every card provides an on-board flexible fault insertion unit (FIU) giving full relay control during testing when applying faults to the Device Under Test (DUT) through NI’s VeriStand interface.
OPAL-RT’s SLSC conditioning boards are part of the Automotive HIL Testbed Reference Architecture, which is an open and customizable solution allowing engineers to test and develop Electric Vehicles and Battery Management Systems in real time, using latest technologies.
With the Automotive HIL Testbed Reference Architecture, OPAL-RT provides an open, flexible solution that you can customize to adapt to changing research requirements for Electric Vehicle and Battery Management System testing.
By combining modular hardware and our FPGA-based simulation solver to easily import real-time models created with any modeling software, these systems help you take advantage of third party components to i) reduce your setup burden and ii) offer a common starting place for your research team members around the world.
With the Automotive HIL Testbed Reference Architecture, researchers can prototype a wide variety of electrical vehicular devices under test (DUTs).
By guiding the integration of complex automotive testing structures and helping engineers to develop specific EV and BMS HIL testing architecture based on best integration practices, OPAL-RT enables automotive manufacturers to cut costs, reduce risks and improve time-to-market.
The solution combines hardware and software from OPAL-RT, National Instruments, and other prime partners in order that each component can provide robust and unique functionality to leverage your EV & BMS testing systems.
The OPAL-RT & Comemso BMS test bench approach allows users to integrate the BMS testing designed for electrical vehicles. OPAL-RT’s NI partnership solution makes it easier to migrate existing physical testbeds onto real-time HIL simulation platforms when testing all type of BMS testing projects.
OPAL-RT provides the engineering required to extend the BMS HIL test bench’s functionalities, from extra protection, shunt emulation, break-out box, current and voltage sensing to complete integration of other controls for electrical vehicles, ADAS systems or a complete vehicle.
