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Biography
Benjamin A. Black is a Principal Market Develop Manager for Power Electronics Real-Time Test at National Instruments and a Lecturer in the Mechanical and Aerospace Engineering Departments of The University of Texas at Austin. He earned his Ph.D. in 2007 from the George Woodruff School of Mechanical Engineering at the Georgia Institute of Technology. His research focused in the use of passive haptic robotics for teleoperation. From 2007 through 2012, he worked as a System Engineer at National Instruments focusing on advanced control and advanced simulation projects. Currently he focuses his time on developing the NI platforms and strategy for the area of power electronics and power systems real-time simulation.
Biography
Mostafa Mahfouz (S’14-M’18) received the B.Sc. and M.Sc. degrees in electrical engineering from Cairo University in 2014 and 2016 respectively. He is currently a PhD candidate at the Centre for Applied Power Electronics (CAPE), Electrical and Computer Engineering Department (ECE), University of Toronto. He is also Engineering Intern (EIT) at Professional Engineers Ontario (PEO). His research interests include AC/DC microgrids’ and electric vehicles fast-charging stations’ operation and control. He has been working as a Research and Teaching Assistant at Cairo University and currently at University of Toronto where he got involved in teaching energy systems and distributed generation, power systems analysis, operation, and control.
Presentation:
In this presentation, we will discuss about using eHS to develop NI controller for DC Fast Charging System (DCFCS) including a local battery storage system.
The key challenge for fast EV charging is the limitations of the existing power grid infrastructure. Fast charging requires a large amount of energy in a very short time, and the distribution power grid was not designed for this. Therefore, the DCFCS includes a battery storage system to reduce the impact of DCFCS that is incurred during charging. Power electronics converter configuration, its controller design and development of a 60-kW prototype will be discussed in this presentation.
Biography
Dr. Nabavi is a Senior Member of IEEE and a professional engineer in the Province of Ontario, Canada. He received the B.Sc. and M.Sc. degrees in electrical engineering from Amirkabir University of Technology, Tehran, Iran, in 1987 and 1990, respectively, and the Ph.D. degree in electrical engineering from the University of Toronto, Toronto, ON, Canada, in 1996. Upon his graduation he joined the University of Mazandaran/Iran as a faculty member in the Department of Electrical and Computer Engineering. Since then he has been actively engaged in research and development in the general area of power systems, and power electronics as well as teaching and supervising of graduate students. He was elevated to the rank of associate professor in 2003. Since 2004, he has been with the Centre for Applied Power Electronics (CAPE), University of Toronto, as a Senior Research Associate and has been actively leading/collaborating on research projects with various utilities and advanced industries. During his academic career, he has supervised more than 29 graduate students, published more than 22 journal papers, 45 technical papers, numerous proprietary industry presentations and technical reports and six patent disclosures in the areas of energy systems, power electronics and power systems.
Presentation:
In this presentation, we will discuss about using eHS to develop NI controller for DC Fast Charging System (DCFCS) including a local battery storage system.
The key challenge for fast EV charging is the limitations of the existing power grid infrastructure. Fast charging requires a large amount of energy in a very short time, and the distribution power grid was not designed for this. Therefore, the DCFCS includes a battery storage system to reduce the impact of DCFCS that is incurred during charging. Power electronics converter configuration, its controller design and development of a 60-kW prototype will be discussed in this presentation.
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Access our Download Center now and learn how to install the software for the demo.
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Main Features
■ Import models from various third-party power electronic simulation software.
■ Include detailed machine models and emulate resolvers and encoders, among others.
■ Change parameters during simulation using scenarios and parameters sets in order to generate faults and abnormal conditions, and to perform manual and automated testing.
■ Simulate complex power electronics circuits in real time, with the best accuracy, on FPGA (with the ability to simulate various converter topologies featuring large numbers of switches)
Discover OPAL-RT’s new range of flexible and configurable conditioning boards with Fault Insertion (FIU) for National Instruments’ Switch, Load, and Signal Conditioning (SLSC) platform.
The SLSC modules enables HIL users to maximize their time and resources through our configurable signal conditioning stage, ensuring that signals are the right level and type, as well as by providing configuration for voltage level shifting, dividing and multiplying or integrated filters and impedance matching.
Every card provides an on-board flexible fault insertion unit (FIU) giving full relay control during testing when applying faults to the Device Under Test (DUT) through NI’s VeriStand interface.
Part of the Automotive HIL Testbed Reference Architecture
OPAL-RT’s SLSC conditioning boards are part of the Automotive HIL Testbed Reference Architecture, which is an open and customizable solution allowing engineers to test and develop Electric Vehicles and Battery Management Systems in real time, using latest technologies.
With the Automotive HIL Testbed Reference Architecture, OPAL-RT provides an open, flexible solution that you can customize to adapt to changing research requirements for Electric Vehicle and Battery Management System testing.
By combining modular hardware and our FPGA-based simulation solver to easily import real-time models created with any modeling software, these systems help you take advantage of third party components to i) reduce your setup burden and ii) offer a common starting place for your research team members around the world.
With the Automotive HIL Testbed Reference Architecture, researchers can prototype a wide variety of electrical vehicular devices under test (DUTs).
By guiding the integration of complex automotive testing structures and helping engineers to develop specific EV and BMS HIL testing architecture based on best integration practices, OPAL-RT enables automotive manufacturers to cut costs, reduce risks and improve time-to-market.
The solution combines hardware and software from OPAL-RT, National Instruments, and other prime partners in order that each component can provide robust and unique functionality to leverage your EV & BMS testing systems.
Automotive HIL Testbed Reference Architecture
The OPAL-RT & Comemso BMS test bench approach allows users to integrate the BMS testing designed for electrical vehicles. OPAL-RT’s NI partnership solution makes it easier to migrate existing physical testbeds onto real-time HIL simulation platforms when testing all type of BMS testing projects. OPAL-RT provides the engineering required to extend the BMS HIL test bench’s functionalities, from extra protection, shunt emulation, break-out box, current and voltage sensing to complete integration of other controls for electrical vehicles, ADAS systems or a complete vehicle.
