With the Automotive HIL Testbed Reference Architecture, OPAL-RT provides an open, flexible solution that you can customize to adapt to changing research requirements for Electric Vehicle and Battery Management System testing.
By combining modular hardware and our FPGA-based simulation solver to easily import real-time models created with any modeling software, these systems help you take advantage of third party components to i) reduce your setup burden and ii) offer a common starting place for your research team members around the world.
With the Automotive HIL Testbed Reference Architecture, researchers can prototype a wide variety of electrical vehicular devices under test (DUTs).
By guiding the integration of complex automotive testing structures and helping engineers to develop specific EV and BMS HIL testing architecture based on best integration practices, OPAL-RT enables automotive manufacturers to cut costs, reduce risks and improve time-to-market.
The solution combines hardware and software from OPAL-RT, National Instruments, and other prime partners in order that each component can provide robust and unique functionality to leverage your EV & BMS testing systems.
Discover OPAL-RT’s new range of flexible and configurable conditioning boards with Fault Insertion (FIU) for National Instruments’ Switch, Load, and Signal Conditioning (SLSC) platform.
